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Postdoc, Beam damage limits Transmission electron microscopy - 2018BAPFWETEF049Posted by: University of Antwerp
Posted date: 2018-Feb-08
The EMAT research group at the Faculty of Science (University of Antwerp) is seeking to fill one full-time
Postdoctoral in the area of smart strategies to break the beam damage limits in transmission electron microscopy
under the supervision of Prof Sandra Van Aert and Prof Jo Verbeeck.
The main goal of the project is to develop and apply smart strategies, which are dedicated to characterize beam-sensitive nanostructures using quantitative scanning transmission electron microscopy (STEM) imaging. This will allow one to use a minimum electron dose to detect single atoms, to determine their atom types and to precisely measure positions of atoms. In this manner, beam damage will be drastically reduced or will even be ruled out completely. The project will focus on the development of novel theoretical methods to optimize the shape of the incoming electron probe and the probe scanning strategy, to experimentally realize the predicted designs and to apply the methods to challenging and relevant beam-sensitive nanostructures.
Profile and requirements
How to apply?
The University of Antwerp is a family friendly organization, with a focus on equal opportunities and diversity. Our HR-policy for researchers was awarded by the European Commission with the quality label HR Excellence in research.
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