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Postdoc, Precise structure characterisation fo scanning Transmission electron microscopy - 2018BAPFWETEF051Posted by: University of Antwerp
Posted date: 2018-Feb-08
The EMAT research group at the Faculty of Science (University of Antwerp) is seeking to fill one full-time
Postdoctoral in the area of precise structure characterisation using fast pixelated detectors for scanning transmission electron microscopy
under the supervision of Prof Sandra Van Aert.
These vacancies are situated in an H2020 ERC Consolidator grant Picometer metrology for light-element nanostructures: making every electron count (PICOMETRICS). The overarching goal of PICOMETRICS is to usher transmission electron microscopy in a new era of non-destructive picometer metrology. Novel data-driven methods will be combined with the latest experimental capabilities to study nanostructures from single low-dose recordings using fast pixelated detectors for scanning transmission electron microscopy (STEM). The required electron dose is envisaged to be four orders of magnitude lower than what is nowadays used. In this manner, beam damage will be drastically reduced or even be ruled out completely. This will enable precise characterisation of nanostructures in their native state; a prerequisite for understanding their properties.
Profile and requirements
How to apply?
The University of Antwerp is a family friendly organization, with a focus on equal opportunities and diversity. Our HR-policy for researchers was awarded by the European Commission with the quality label HR Excellence in research.
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